Hi,
with reference to Virtuoso IC6.1.8-64b.500.13
I've recently come across the Measurement Description Language, although I gather this has been available r for many years now.
The possibility of re-using patterns for measurement tasks is of course very appealing, and I also saw that sweeps of different kinds are supported too.
The only sub-optimal point, as I seem to understand, is that only 'classic Spectre' simulations are supported, and none of the RF analyses which I also tend to use;
However, I've seen that MDL can be also used for pure post-processing, meaning its measurement powers could be put to good use no matter what the underlying simulation is.
I am wondering though, how is the working model thought to be for Spectre/MDL? I mean, it doesn't look like it's involving any of the ADE tools for simulation management, right?
The nice thing about ADE (L/XL Assembler/Explorer) is that they manage process spawning to several machines/jobs when having to do with sweeps or multi-test bench situations.
Is this functionality achievable - at least in principle - by resorting to Spectre/MDL only? Is it more complicated, just needs some acquaintance, or not possible at all?
Regards,
Michele