good afternoon,
For a high dynamic range CT SD ADC we need a few calibrations prior to running MC process & mismatch verification. We were wondering about possibility to run these (analog) calibrations inside test suite using another test bench containing only the relevant sub circuits taken from the main test bench, to save on compute resources as a single transient verification on ADC full schematic takes really a long time. We then, for each MC iteration, need to enforce the same mismatch variations on the sub circuits used in the calibration testbench as will be applied on same sub circuits in main test bench. Can this be accomplished with Maestro ?
kind regards
Hans