Picking corner dependent variables for monte carlo simulation

I have two simulations:

1. Calibration sim - (used to obtain a 5 bit variable)

2. Actual sim - (uses 5 bit variable from calibration sim to check other transient conditions)

I run the first sim (calibration sim) across 7 corners (TT, FF, SS, FS, SF, SSAG, FFAG) and get a set of 5 trim bit variables calibrated according to the corner. The variable is called cal_code<4:0> (5 variables). 

Now I want to run a process+mismatch 500 point monte carlo (global + local) on the second sim (actual sim) using the info from the calibration sim in such a way that it picks the right set of 5 bits for the corresponding corner in each iteration of the monte carlo sim. 

Essentially this is similar to what would happen in real life silicon. A single wafer would first be calibrated to obtain a correct 5 bit setting and then the calibrated setting would be used to test all further things for that chip. So in analogy, each individual chip that is manufactured can be considered a single iteration of the monte carlo.

Any ideas on how to do this?

community.cadence.com/.../monte-carlo-on-a-verilog-a-custom-macro-model-based-on-device-instance-not-subckt-instance

This would have been helpful if I was just doing corner runs and not monte carlo.